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FT-8200 双电四探针粉末电阻率测试仪

发布时间: 2023-06-12 14:57:48 点击: 212

双电四探针粉末电阻率测试仪

一、功能概述:

瑞柯FT-8200双电四探针粉末电阻率测试系统(智能型)量程方阻测量范围、可测量到-5次方或-6次方,采用集成电路模块;智能一体化结构设计,整体大方, USB,232通讯接口,高精恒直流恒流源 ,提供四探针法和四端法两种测量模式并存, 全程采用PC软件操作,自动测试过程数据曲线及图谱分析,实时分析压强/压力与电阻,电阻率,电导率的变化关系,及报表生成,存储,打印等.

双电四探针粉末电阻率测试仪

二、满足标准:

1)四探针测试仪满足GB/T 1551、GB/T1552-1995,ASTM F84美国A.S.T.M 标准.

The four-probe tester meets GB/T 1551, GB/t1552-1995, ASTM F84 U.S. A.S.T.M standard.

2)四探针法粉末测试平台依据GBT 30835-2014《锂离子电池用炭复合磷酸铁锂正材料》中关于粉末电导率的测定方法中用于仲裁方法的四探针法要求制作.

Four point probe method test platform based on GBT powder 30835-2014 “The lithium ion battery with carbon compound lithium iron phosphate cathode material "method for determination of the conductivity of powder in four point probe method for arbitration method in the request.


双电四探针粉末电阻率测试仪
三、适用范围:Scope of application

广泛用于锂离子电池用炭复合磷酸铁锂正材料电阻率的测量;也应用于需要采用四探针法测量的导体或半导体粉末材料的分析与检测;用于石墨类粉状材料电阻率的测量;广泛应用于外企业品质检测;研发部门,大中专院校;科研院所;及质量检测机构.

Widely used in the measurement of resistivity of lithium anode materials used in lithium ion batteries.It also applies to the analysis and detection of a conductor or semiconductor powder material that needs to be measured by four probes.Measurement of resistivity of graphite powder materials;It is widely used in domestic and foreign enterprise quality testing.The research and development department, the college of major and secondary schools;Research institutes and Quality monitoring organization.

双电四探针粉末电阻率测试仪

规格型号/ Specification model

FT-8200A

FT-8200B

1.方块电阻范围sheet resistance range

10-5~2×105Ω/□

10-6~2×105Ω/□

2.电阻率范围

resistivity range

10-6~2×106Ω-cm

10-7~2×107Ω-cm

电导率范围Conductivity range

5×10-6~106ms/cm

5×10-7~107ms/cm

3.测试电流范围

test current range

0.1μA ,1μA,10μA,100µA,1mA,10mA,100 mA

10μA,100µA,1mA,10mA,100 mA、1000mA

4.电流精度

current accuracy

±0.1%

±0.1%

软件界面


电阻、电阻率、方阻、温度、单位切换、温度系数、电流、电压、探针形状、探针间距、厚度 、电导率、图谱显示,压力设定,zui小压强,zui大压强,报表导出,波形刷新,时间设定,启动、停止、运行

resistance, resistivity, sheet resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity. Graph shows, pressure setting, minimum pressure, maximum pressure, report export, waveform refresh, time setting, start, stop, run

6.测试方式Test method:

双电组合测量

ordinary single electrical measurement

7.模具选购Choose to buy mold:

:模具A内径:20mm ;模具B:内径10mm

mold A inner diameter:20mm

mold B: inner diameter 10mm

8.压力选购

Choose to buy pressure:

压力A:0-1000kg; 压力B:0-200kg

Pressure A:0-1000kg

Pressure B:0-200kg

9. 模腔行程:Die cavity stroke:

0-30mm(样品压实厚度建议在4mm内)

0-30mm(Sample compaction thickness is recommended in 4mm)

10.高度测量范围:Altimeter measurement range:

0-25mm分辨率0.01mm位移传感器

0.25mm resolution 0.01mm

high precision laser displacement sensor

11. 恒压时间:Constant pressure time:

0-999s

12.整机重复性误差: errors

≤4.5%(平均性误差,人为因数外)

: ≤4.5% ( average error, except human factor)

≤3%(平均性误差,人为因数外)

: ≤3% ( average error, except human factor)

工作电源:

Power supply:

输入: AC 220V±10% ,50Hz功 耗:<60W

input: AC 220V±10% ,50Hz  <60W

15.选购:

1)四探针探头及平台(固体半导体材料测量使用)Four probe probe head and platform

3)标准电阻。用于校准仪器

Standard resistance.Calibrated instrument





























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